Investigation of the interface grading in III‐V heterostructures by double‐crystal diffractometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.342970
Reference9 articles.
1. The interpretation of X-ray rocking curves from III–V semiconductor device structures
2. X‐ray double‐crystal characterization of highly perfect InGaAs/InP grown by vapor‐phase epitaxy
3. X-ray diffraction of multilayers and superlattices
4. Inhomogeneity of liquid‐phase‐epitaxial InGaAsP lattice matched on InP: Effects of transient growth
5. Abruptness of InGaAs/InP heterointerface grown by liquid phase epitaxy
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction;Characterization of Semiconductor Heterostructures and Nanostructures;2008
2. Étude des interfaces enterrées par diffraction de rayons X;Le Journal de Physique IV;1997-12
3. Optimization of group V switching times for InGaP/GaAs heterostructures grown by LP-MOCVD;Compound Semiconductors 1997. Proceedings of the IEEE Twenty-Fourth International Symposium on Compound Semiconductors;1997
4. Dopant‐induced lattice dilation in n‐type InP homoepitaxial layers;Journal of Applied Physics;1996-05-01
5. A high-resolution X-ray diffraction study in InGaAs/InP superlattices;Journal of Physics D: Applied Physics;1995-04-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3