Author:
Halliwell M.A.G.,Lyons M.H.,Hill M.J.
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference16 articles.
1. Microscopy of Semiconductor Materials, Oxford, 1981;Halliwell,1981
2. Assessment of epitaxial layers by automated scanning double axis diffractometry
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4. M.J. Hill, B.K. Tanner, M.A.G. Halliwell and M.H. Lyons, J. Appl. Cryst., submitted.
5. Dynamical theory of diffraction applicable to crystals with any kind of small distortion
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