Influence of mismatch on the defects in relaxed epitaxial InGaAs/GaAs(100) films grown by molecular beam epitaxy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.354827
Reference22 articles.
1. Recent trends in III–V strained layer research
2. Characterization of pseudomorphic InGaAs channel modulation‐doped field‐effect‐transistor structures grown by molecular‐beam epitaxy
3. A New High Electron Mobility Transistor (HEMT) Structure with a Narrow Quantum Well Formed by Inserting a Few Monolayers in the Channel
4. A 970 nm strained‐layer InGaAs/GaAlAs quantum well laser for pumping an erbium‐doped optical fiber amplifier
5. Excellent uniformity and very low (<50 A/cm2) threshold current density strained InGaAs quantum well diode lasers on GaAs substrate
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1. The influence of In composition on properties of In x Ga 1-x As/GaAs structures grown by MOVPE and in situ monitored by spectral reflectance;Superlattices and Microstructures;2017-01
2. Metalorganic Vapor Phase Epitaxy of InAs Layers on GaAs Substrates Using Low-Temperature Growth of InGaAs Graded Buffer Layers;Japanese Journal of Applied Physics;2004-06-25
3. Effect of In-content on the misfit dislocation interaction in InGaAs/GaAs layers;Thin Solid Films;1999-04
4. Influence of Lattice Misfit on Surface Morphology of Vanadyl-Phthalocyanine Molecular Beam Epitaxy Films Grown on KCl/KBr Mixed-Crystal Substrates;Japanese Journal of Applied Physics;1998-02-15
5. Atomic diffusion induced by stress relaxation in InGaAs/GaAs epitaxial layers;Journal of Applied Physics;1997-08
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