Pressure dependence of the electron capture cross section of theBhole trap in liquid phase epitaxial gallium arsenide
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94443
Reference10 articles.
1. Nonradiative capture and recombination by multiphonon emission in GaAs and GaP
2. Pressure dependence of the energy levels of irradiation‐induced defects in GaAs
3. Pressure dependence of deep levels in GaAs
4. Fast capacitance transient appartus: Application to ZnO and O centers in GaP p‐n junctions
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1. Defect Levels in n-Type Gallium Arsenide and Gallium Aluminum Arsenide Layers;physica status solidi (a);2001-02
2. Carrier-induced dynamic strain effects in semiconductor nanocrystals;Journal of Materials Science;1998-09
3. Influence of hydrostatic pressure on DX-centre levels in GaAs1−xPx:S;Philosophical Magazine B;1993-01
4. Hydrostatic pressure effects on oxygen-related irradiation-produced defects in silicon;Radiation Effects and Defects in Solids;1989-12
5. Pressure dependence of deep electronic levels in semiconductors: Phosphorus-vacancy pair (or SiEcenter) and divacancy in silicon;Physical Review B;1989-06-15
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