Application of phase-retrieval x-ray diffractometry to carbon doped SiGe(C)∕Si(C) superlattice structures. II. High resolution reconstruction using neural network root finder technique
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2201447
Reference16 articles.
1. The influence of substitutional carbon on the Si/Ge interdiffusion studied by x-ray diffractometry at superlattice structures
2. Application of phase-retrieval x-ray diffractometry to carbon doped SiGe(C)/Si(C) superlattice structures
3. A. Y. Nikulin, in Recent Research Developments in Applied Physics, edited by M. Kawasaki, N. Ashgriz, and R. Anthony (Transworld Research Network, Trivandrum, India, 1998), Vol. 1, p. 1.
4. The characterization of SiGe/Si multilayers via an unambiguous solution of the inverse problem in x-ray Bragg diffraction
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