High Temperature Camera for X‐Ray Topography
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1720788
Reference8 articles.
1. A method for the examination of crystal sections using penetrating characteristic X radiation
2. Direct Observation of Individual Dislocations by X‐Ray Diffraction
3. A study of lattice distortion by an x-ray diffraction technique
4. Applications of `limited projection topographs' and `direct beam topographs' in diffraction topography
5. Direct X-ray observation of dislocations during annealing in aluminium single crystals
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1. Stress in chemical‐vapor‐deposited SiO2and plasma‐SiNxfilms on GaAs and Si;Journal of Applied Physics;1983-09
2. Temperature dependence of the internal mechanical stresses in the Si-SiO2 system;Applications of Surface Science;1982-11
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4. Orthorhombic magnetic anisotropy in garnet epitaxial films containing europium;Journal of Applied Physics;1977-11
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