Broadband dielectric microwave microscopy on micron length scales-Reference-Cited by-同舟云学术

Broadband dielectric microwave microscopy on micron length scales

Published:2007 Issue:4 Volume:78 Page:044701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Tselev Alexander,Anlage Steven M.,Ma Zhengkun,Melngailis John

Publisher

AIP Publishing

Subject

Instrumentation

Reference21 articles.

1. High-frequency near-field microscopy

2. S. M. Anlage, V. V. Talanov, and A. R. Schwartz , inScanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, edited by S. V. Kalinin and A. Gruverman (Springer, New York, 2007).

3. Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

4. Exploration of artificial multiferroic thin-film heterostructures using composition spreads

5. Phase separation in La5∕8Sr3∕8MnO3(30%)+LuMnO3(70%) bulk sample studied by scanning microwave microscopy

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