Author:
Kawase Tatsuya,Mura Atsushi,Dei Katsuya,Nishitani Keisuke,Kawai Kentaro,Uchikoshi Junichi,Morita Mizuho,Arima Kenta
Abstract
Abstract
We propose the metal-assisted chemical etching of Ge surfaces in water mediated by dissolved oxygen molecules (O2). First, we demonstrate that Ge surfaces around deposited metallic particles (Ag and Pt) are preferentially etched in water. When a Ge(100) surface is used, most etch pits are in the shape of inverted pyramids. The mechanism of this anisotropic etching is proposed to be the enhanced formation of soluble oxide (GeO2) around metals by the catalytic activity of metallic particles, reducing dissolved O2 in water to H2O molecules. Secondly, we apply this metal-assisted chemical etching to the nanoscale patterning of Ge in water using a cantilever probe in an atomic force microscopy setup. We investigate the dependences of probe material, dissolved oxygen concentration, and pressing force in water on the etched depth of Ge(100) surfaces. We find that the enhanced etching of Ge surfaces occurs only when both a metal-coated probe and saturated-dissolved-oxygen water are used. In this study, we present the possibility of a novel lithography method for Ge in which neither chemical solutions nor resist resins are needed.
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,General Materials Science
Reference25 articles.
1. Matsubara H, Sasada T, Takenaka M, Takagi S: Evidence of low interface trap density in GeO2/Ge metal-oxide-semiconductor structures fabricated by thermal oxidation. Appl Phys Lett 2008, 93: 032104. 10.1063/1.2959731
2. Leancu R, Moldovan N, Csepregi L, Lang W: Anisotropic etching of germanium. Sens Actuators A-Phys 1995, 46: 35–37. 10.1016/0924-4247(94)00856-D
3. Fang C, Foll H, Carstensen J: Electrochemical pore etching in germanium. J Electroanal Chem 2006, 589: 259–288. 10.1016/j.jelechem.2006.02.021
4. Kern W, Puotinen DA: Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology. RCA Review 1970, 31: 187–206.
5. Ohmi T: Total room temperature wet cleaning for Si substrate surface. J Electrochem Soc 1996, 143: 2957–2964. 10.1149/1.1837133
Cited by
41 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献