1. Mathematics in industry;HHJM Janssen,2016
2. Janssen R, ter Maten J, Tischendorf C, Brachtendorf H-G, Bittner K, Schoenmaker W, Benner P, Feng L, Pulch R, Deleu F, Wieers A. The nanoCOPS project on algorithms for nanoelectronic coupled problems solutions. In: Schreffler B, Oñate E, Papadrakakis M, editors. Coupled problems in science and engineering VI - COUPLED PROBLEMS 2015. Barcelona: CIMNE - International Center for Numerical Methods in Engineering; 2015. p. 1029-36. ISBN 978-84-943928-3-2.
3. Banagaaya N, Feng L, Schoenmaker W, Meuris P, Wieers A, Gillon R, Benner P. Model order reduction for nanoelectronics coupled problems with many inputs. In: Proceedings of design, automation and test in Europe (DATE). 2016. p. 313-8. Paper 0996.
4. Casper T, De Gersem H, Gotthans T, Schoenmaker W, Schöps S, Wieers A. Electrothermal simulation of bonding wire degradation under uncertain geometries. In: Proceedings of design, automation and test in Europe (DATE). 2016. p. 1297-302. Paper 0776.
5. Putek P, Meuris P, Pulch R, ter Maten EJW, Günther M, Schoenmaker W, Deleu F, Wieers A. Shape optimization of a power MOS device under uncertainties. In: Proceedings of design, automation and test in Europe (DATE). 2016. p. 319-24. Paper 0998.