Author:
Tan Cher Ming,Chen Xiangchen
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Reference19 articles.
1. Y Jiang, IEEE Symposium on VLSI Technology Digest of Technical Papers, 17-19, 2008
2. L Wen, IEEE EDL 31(9), 915-17, 2010
3. A Amerasekera, IEEE Trans. on Electron Devices 39(2), 6–430 (1992)
4. Sentaurus simulation suite, Synopsys (Mountain View, CA, 2011)
5. XC Chen, CM Tan, Microelectronics Reliability, in press (2013). http://dx.doi.org/10.1016/j.microrel.2013.12.009
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