Automatic Background Estimation and Quantitative Analysis for XPS Spectrum by Active Shirley Method
Author:
Affiliation:
1. National Institute of Technology, Yonago College
2. University of Tsukuba
3. National Institute for Materials Science
4. Scienta Omicron
Publisher
Surface Analysis Society of Japan
Link
https://www.jstage.jst.go.jp/article/jsa/22/3/22_155/_pdf
Reference6 articles.
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