Alternation of Ti 2p XPS Spectrum for TiO2 by Ar Ion Bombardment
Author:
Affiliation:
1. Kokan Keisoku K.K.
2. ULVAC-PHI
Publisher
Surface Analysis Society of Japan
Link
http://www.jstage.jst.go.jp/article/jsa/9/3/9_3_459/_pdf
Reference14 articles.
1. Criteria for bombardment-induced structural changes in non-metallic solids
2. Correction of Peak Shift and Classification of Change of X-ray Photoelectron Spectra of Oxides as a Result of Ion Sputtering
3. ESCA studies of metal-oxygen surfaces using argon and oxygen ion-bombardment
4. On the problem of whether mass or chemical bonding is more important to bombardment-induced compositional changes in alloys and oxides
5. Angular resolved x-ray photoemission study of defects induced by ion bombardment on the TiO2 surface
Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. In Situ X-ray Photoelectron Spectroscopy Study of Initial Stages of Tungsten Trioxide Reduction by Low-Energy Hydrogen Bombardment;The Journal of Physical Chemistry C;2024-03-15
2. Using hard X-ray photoelectron spectroscopy to study a SiO2/HfO2-based interface dipole modulation stack embedded in a metal–insulator-metal structure;Applied Physics Express;2022-11-01
3. Electrically induced change in HfO2/1-monolayer TiO2/SiO2 metal-oxide-semiconductor stacks: capacitance–voltage and hard X-ray photoelectron spectroscopy studies;Applied Physics Express;2021-06-23
4. Direct nanocrystallite size investigation in microstrained mixed phase TiO2 nanoparticles by PCA of Raman spectra;Applied Surface Science;2019-03
5. Low temperature preparation of HfO2/SiO2stack structure for interface dipole modulation;Applied Physics Letters;2018-12-17
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3