Correction of Peak Shift and Classification of Change of X-ray Photoelectron Spectra of Oxides as a Result of Ion Sputtering-Reference-Cited by-同舟云学术

Correction of Peak Shift and Classification of Change of X-ray Photoelectron Spectra of Oxides as a Result of Ion Sputtering

Published:1992-12 Issue:12 Volume:18 Page:799-806
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Hashimoto Satoshi,Hirokawa Kichinosuke,Fukuda Yasuo,Suzuki Ken-ichi,Suzuki Toshiko,Usuki Noriaki,Gennai Norio,Yoshida Sizuo,Koda Mitsuru,Sezaki Hiroshi,Horie Hiroshi,Tanaka Akihiro,Ohtsubo Takashi

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference30 articles.

1. Surface analysis of metal. 1 Activity report of Surface Analysis Subcommittee of the Iron and Steel Analysis Committee, the Joint Research Society of ISIJ.

2. Surface analysis of metal. 2 Activity report of surface analysis subcommittee of the iron and steel analysis committee, the joint research society of isij.

3. Measurement of Ion Sputtering Yields for In-depth Profiling Analysis

4. Correction of the Instrumental Factor in Quantitative Analysis of Auger Electron Spectroscopy

5. Observation of Fine Structure in Auger Electron Spectra for Chemical State Analysis

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