Deriving the exchange times for a model of trap-assisted tunnelling-Reference-Cited by-同舟云学术

Deriving the exchange times for a model of trap-assisted tunnelling

Published:2020-02-01 Issue:1 Volume:71 Page:31-36
ISSN:1339-309X
Container-title:Journal of Electrical Engineering
language:en
Short-container-title:

Author:

Racko Juraj¹,Mikolášek Miroslav¹,Kadlečíková Magdaléna¹,Benko Peter¹,Chvála Aleš¹

Affiliation:

1. Slovak University of Technology , Ilkovičova 3, 812 19 Bratislava , Slovakia

Abstract

Abstract The work presents a physical model of trap-assisted tunnelling that allows assessing the impact of traps upon the total current through metal/semiconductor heterostructures. The model is based on expressing the occupation probability of the trapping centres by electrons in terms of thermal and tunnelling capture and emission times, commonly referred to as exchange times. The occupation probabilities calculated in this way are then used to evaluate the generation-recombination rates occurring in the continuity equations.

Publisher

Walter de Gruyter GmbH

Link

https://www.sciendo.com/pdf/10.2478/jee-2020-0004

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