Current transport mechanism in trapped oxides: A generalized trap-assisted tunneling model
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.370918
Reference9 articles.
1. Modeling and simulation of stress-induced leakage current in ultrathin SiO/sub 2/ films
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3. Electrical stress-induced variable range hopping conduction in ultrathin silicon dioxides
4. Carrier conduction in ultrathin nitrided oxide films
5. Nitridation‐enhanced conductivity behavior and current transport mechanism in thin thermally nitrided SiO2
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