X-ray diffraction study of short-period AlN/GaN superlattices-Reference-Cited by-同舟云学术

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X-ray diffraction study of short-period AlN/GaN superlattices

Published:2013-12 Issue:7 Volume:58 Page:953-958
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Kyutt R. N.,Shcheglov M. P.,Ratnikov V. V.,Yagovkina M. A.,Davydov V. Yu.,Smirnov A. N.,Rozhavskaya M. M.,Zavarin E. E.,Lundin V. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774513070109.pdf

Reference14 articles.

1. S.-S. Hofstetter, H. Schad, W. Wu, et al., Appl. Phys. Lett. 83, 572 (2003).

2. L. Doyennette, M. Nevou, M. Tchernycheva, et al., Electron. Lett. 41, 1077 (2005).

3. N. Iizuka, K. Kaneko, and N. Suzuki, Electron. Lett. 40, 962 (2000).

4. K. Driscoll, A. Bhattacharyya, T. D. Moustakas, et al., Appl. Phys. Lett. 91, 141104 (2007).

5. M. Nevou, F. H. Julien, M. Tchernycheva, et al., Appl. Phys. Lett. 92, 161105 (2008).

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1. III-Nitride Short Period Superlattices for Deep UV Light Emitters;Applied Sciences;2018-11-23

2. Reciprocal-Space Maps of X-Ray Diffraction Intensity Distribution and Their Relation to the Dislocation Structure of Epitaxial Layers;Technical Physics Letters;2018-06

3. Elastic strains and delocalized optical phonons in AlN/GaN superlattices;Semiconductors;2016-08

4. The Peculiarities of Strain Relaxation in GaN/AlN Superlattices Grown on Vicinal GaN (0001) Substrate: Comparative XRD and AFM Study;Nanoscale Research Letters;2016-05-17

5. Elastic strains effect on frequencies of delocalized polar phonons in AlN/GaN superlattices;AIP Conference Proceedings;2016

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