Studies on the RF sputtered amorphous SiGe thin films-Reference-Cited by-同舟云学术

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Studies on the RF sputtered amorphous SiGe thin films

Published:2006-01 Issue:1 Volume:42 Page:3-6
ISSN:0020-1685
Container-title:Inorganic Materials
language:en
Short-container-title:Inorg Mater

Author:

Serényi M.,Lohner T.,Zolnai Z.,Petrik P.,Nemcsics Á.,Khánh N. Q.,Turmezei P.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering

Link

http://link.springer.com/content/pdf/10.1134/S002016850601002X.pdf

Reference24 articles.

1. Mui, K., Basa, D.K., Smith, F.W., and Corderman, R., Phys. Rev. B: Condens. Matter, 1987, vol. 35, no. 17, pp. 8089–9102.

2. Basa, D.K., Solid State Commun., 2001, vol. 118, no. 10, pp. 535–539.

3. Basa, D.K., Thin Solid Films, 2002, vol. 406, no. 1/2, pp. 75–78.

4. Mousseau, N. and Thorpe, M.F., Phys. Rev. B: Condens. Matter, 1993, vol. 48, no. 8, pp. 5172–5178.

5. Qi, W., Antoniadis, H., Schiff, E.A., and Guha, S., Phys. Rev. B: Condens. Matter, 1993, vol. 47, no. 15, pp. 9435–9448.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry;Materials Science in Semiconductor Processing;2022-12

2. Micro-combinatorial sampling of the optical properties of hydrogenated amorphous $$\hbox {Si}_{1-x}\,\hbox {Ge}_{{x}}$$ for the entire range of compositions towards a database for optoelectronics;Scientific Reports;2020-11-06

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