Structural characterization of quantum-well layers by double-crystal X-ray diffractometry-Reference-Cited by-同舟云学术

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Structural characterization of quantum-well layers by double-crystal X-ray diffractometry

Published:2003-09 Issue:5 Volume:48 Page:728-743
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Afanas’ev A. M.,Imamov R. M.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/1.1612593.pdf

Reference31 articles.

1. Jurgen H. Smet, T. P. E. Brockaert, and C. G. Fonstad, J. Appl. Phys. 71, 2475 (1992).

2. F. Schaffler, Semicond. Sci. Technol., No. 12, 1515 (1997).

3. Zh. I. Alferov, Fiz. Tekh. Poluprovodn. (St. Petersburg) 32(1), 3 (1998) [Semiconductors 32, 1 (1998)].

4. A. M. Afanas’ev, P. A. Alexandrov, R. M. Imamov, et al., Acta Crystallogr., Sect. A: Found. Crystallogr. 40, 352 (1984).

5. S. S. Yakimov, V. A. Chaplanov, A. M. Afanas’ev, et al., Pis’ma Zh. Éksp. Teor. Fiz. 39, 3 (1984) [JETP Lett. 39, 1 (1984)].

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