Structural and electrical properties of quantum wells with nanoscale InAs inserts in In y Al1 − y As/In x Ga1 − x As heterostructures on InP substrates-Reference-Cited by-同舟云学术

Structural and electrical properties of quantum wells with nanoscale InAs inserts in In y Al1 − y As/In x Ga1 − x As heterostructures on InP substrates

Published:2011-03 Issue:2 Volume:56 Page:298-309
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Vasil’ev A. L.,Vasil’evskii I. S.,Galiev G. B.,Imamov R. M.,Klimov E. A.,Kovalchuk M. V.,Ponomarev D. S.,Roddatis V. V.,Subbotin I. A.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774511020180.pdf

Reference26 articles.

1. Y. Yamashita, A. Endon, et al., IEEE Electron Dev. Lett. 23(10), 573 (2002).

2. X. Wallart, B. Pinsard, and F. Mollot, J. Appl. Phys. 97, 053 706 (2005).

3. J. Huang, W. Hsu, et al., Semicond. Sci. Technol. 21, 619 (2006).

4. Y. Chen, W. Hsu, et al., Solid State Electron. 48, 119 (2004).

5. W. J. Stillman and M. S. Shur, J. Nanoelectron. Optoelectron. 2, 209 (2007).

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