System-on-chip: Specifics of radiation behavior and estimation of radiation hardness-Reference-Cited by-同舟云学术

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

Published:2016-01 Issue:1 Volume:45 Page:33-40
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Kalashnikov O. A.,Nekrasov P. V.,Nikiforov A. Yu.,Telets V. A.,Chukov G. V.,Elesin V. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739716010066.pdf

Reference20 articles.

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3. Sogoyan, A.V., Chumakov, A.I., and Nikiforov, A.Y., Method for predicting cmos parameter degradation due to ionizing radiation with regard to operating time and conditions, Russ. Microelectron., 1999, vol. 28, no. 4, pp. 224–235.

4. Chumakov, A.I., Nikiforov, A.Y., Telets, V.A., et al., IC space radiation effects experimental simulation and estimation methods, Rad. Meas., 1999, no. 5, pp. 547–552.

5. Sogoyan, A.V., Artamonov, A.S., Nikiforov, A.Y., and Boychenko, D.V., Method for integrated circuits total ionizing dose hardness testing based on combined gamma and X-ray irradiation facilities, Facta Univ., Ser.: Electron. Energet., 2014, vol. 27, no. 3, pp. 329–338.

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