Implementation of the optimal construction of a combination device and evaluation of reliability by output voltage-Reference-Cited by-同舟云学术

Implementation of the optimal construction of a combination device and evaluation of reliability by output voltage

Published:2022-01-08 Issue:4 Volume:14 Page:130-139
ISSN:2219-0767
Container-title:Modeling of systems and processes
language:en
Short-container-title:

Author:

Makarenko F.¹,Yagodkin A.¹,Zolnikov Konstantin²,Denisova O.¹

Affiliation:

1. Voronezh State University of Forestry and Technologies named after G.F. Morozov

2. AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

Abstract

The theoretical propositions of the algebra of logic are considered. It is noted that the current microcircuitry based on the algebra of logic contains logical statements: true (yes) is a logical unit, false (no) is a logical zero. Based on the given logical function: ((ABC)×D + A×(BCD) + A×(BC)×D + (AB)×(CD), frontal, minimal, transformed minimal variants of the combination device are implemented, as well as minimized variants in the bases "AND-NOT" and "OR-NOT". A combination device based on import-substituting chips of 155, 176 series has been designed. The analysis of the obtained devices is made from the standpoint of technical and economic indicators, in particular, an assessment of the number of logic elements used, an assessment of the symmetry of the structure, as a result, a reduction in energy consumption, an increase in performance, improvements in parameters for reliability of functioning, a decrease in weight and size characteristics. Assuming that the law of change of the information parameter U1 is close to linear, taking into account the effect of temperature as boundary values for the elements of the applied microcircuits, taking the values -60 °C and +120°. Accordingly, the parametric reliability of the optimal implementation of the device according to the output voltage parameter is calculated. The conclusion is made about the inverse dependence of parametric reliability on temperature growth. A recommendation is given when evaluating parametric reliability for a number of other information parameters about the need to take into account both the number of chips used and the type of their interconnections.

Publisher

Infra-M Academic Publishing House

Subject

General Medicine

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