Estimating the spin diffusion length and the spin Hall angle from spin pumping induced inverse spin Hall voltages
Author:
Funder
Microelectronics Advanced Research Corporation
Defense Advanced Research Projects Agency
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.96.174432/fulltext
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1. Coupling between ferromagnetic and conduction-spin-resonance modes at a ferromagnetic—normal-metal interface
2. Ferromagnetic resonance linewidth for NM/80NiFe/NM films (NM=Cu, Ta, Pd and Pt)
3. The Study on Ferromagnetic Resonance Linewidth for NM/80NiFe/NM (NM=Cu, Ta, Pd and Pt) Films
4. Effect of spin diffusion on Gilbert damping for a very thin permalloy layer in Cu/permalloy/Cu/Pt films
5. Magnetic relaxation of normal-metal (NM)/80NiFe/NM films
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