Dynamics of weak magnetic coupling by x-ray ferromagnetic resonance

Author:

Kim Changsoo1ORCID,Choi Won-Chang2ORCID,Moon Kyoung-Woong1ORCID,Kim Hyun-Joong1,An Kyongmo1ORCID,Park Byeong-Gyu3ORCID,Kim Ho-young4ORCID,Hong Jung-il2ORCID,Kim Jaeyoung5ORCID,Qiu Zi Q.6ORCID,Kim Younghak3ORCID,Hwang Chanyong1ORCID

Affiliation:

1. Quantum Technology Institute, Korea Research Institute of Standards and Science 1 , Daejeon 34113, Republic of Korea

2. Department of Emerging Materials Science, Daegu Gyeongbuk Institute of Science and Technology 2 , Daegu 42988, Republic of Korea

3. Pohang Accelerator Laboratory, Pohang University of Science and Technology 3 , Pohang 37673, Republic of Korea

4. Max Plank POSTECH/Korea Center for Complex Phase Materials 4 , Pohang 37673, Republic of Korea

5. Center for Artificial Low Dimensional Electronic System, Institute for Basic Science 5 , Pohang 37673, Republic of Korea

6. Department of Physics, University of California at Berkeley 6 , Berkeley, California 94720, USA

Abstract

We investigate the interaction between two magnetic layers separated with a normal metal insertion layer (Ti, Pt, and Ru) using x-ray ferromagnetic resonance (XFMR). We measure the amplitude and phase of the ferromagnetic resonance of both layers. Our results indicate that a ferromagnetic exchange coupling between two layers is a dominant coupling mechanism for a thick insertion metal layer. Based on the exchange coupling model, we extract the smallest value of the indirect exchange coefficient of 1.2 μJ/m2, which corresponds to an exchange field of about 0.36 mT. While this value is difficult to measure with other experimental tools, we were able to measure the small value because XFMR detects a resonance phenomenon of a thin layer generated by an oscillating indirect exchange and the Oersted fields with a phase and layer resolved observation.

Funder

National Research Foundation of Korea

Publisher

AIP Publishing

Subject

General Physics and Astronomy

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