X-ray reflection from rough layered systems
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.47.15896/fulltext
Reference17 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Determination of roughness correlations in multilayer films for x‐ray mirrors
3. Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses
4. Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
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