Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.350976
Reference22 articles.
1. Microcleavage transmission electron microscopy applied to the interfacial structure of multilayers and microstructure of small particles on a substrate
2. The structure of ultrathin C/W and Si/W multilayers for high performance in soft x‐ray optics
3. Determination of roughness correlations in multilayer films for x‐ray mirrors
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