Microcleavage transmission electron microscopy applied to the interfacial structure of multilayers and microstructure of small particles on a substrate-Reference-Cited by-同舟云学术

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Microcleavage transmission electron microscopy applied to the interfacial structure of multilayers and microstructure of small particles on a substrate

Published:1987-05-25 Issue:21 Volume:50 Page:1480-1481
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lepêtre Y.,Ziegler E.,Schuller Ivan K.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.97806

Reference4 articles.

1. For recent work see Surf. Sci.106(1981) SUSCAS0039-6028

2. and156(1985).SUSCAS0039-6028, Surf. Sci.

3. Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy

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2. Quantitative roughness of sputtered Fe-Cr superlattices;The European Physical Journal B;2002-11

3. Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses;Journal of Applied Physics;1992-04

4. Particle-size effects in single-electron tunnel systems;Zeitschrift f�r Physik B Condensed Matter;1991-10

5. Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers;Journal of Applied Physics;1991-02

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