X-ray analysis of the short-range order in the ordered-alloy domains of epitaxial (Ga,In)P layers by diffraction anomalous fine structure of superlattice reflections-Reference-Cited by-同舟云学术

X-ray analysis of the short-range order in the ordered-alloy domains of epitaxial (Ga,In)P layers by diffraction anomalous fine structure of superlattice reflections

Published:1999-06-15 Issue:23 Volume:59 Page:15253-15260
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Meyer Dirk C.,Richter Kurt,Paufler Peter,Wagner Gerald

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.15253/fulltext

Reference14 articles.

1. Ordering effect on the performance of Ga0.5In0.5P visible light‐emitting diodes grown by metalorganic chemical vapor deposition

2. Atomic Structure of Ordered InGaP Crystals Grown on (001)GaAs Substrates by Metalorganic Chemical Vapor Deposition

3. Generation of strong composition‐modulated structures and absence of ordered structures in InGaP crystals grown on (110) GaAs substrates by metalorganic chemical vapor deposition

4. Transmission electron microscopic study of the ordered structure in GaInP/GaAs epitaxially grown by metalorganic chemical vapor deposition

5. EXTENDED FINE STRUCTURE OF BRAGG REFLECTIVITY OF COPPER SULPHATE IN THE VICINITY OF COPPER K-EDGE

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