Model for stress and volume changes of a thin film on a substrate upon annealing: Application to amorphous Mo/Si multilayers-Reference-Cited by-同舟云学术

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Model for stress and volume changes of a thin film on a substrate upon annealing: Application to amorphous Mo/Si multilayers

Published:1991-12-15 Issue:24 Volume:44 Page:13519-13533
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Loopstra O. B.,van Snek E. R.,de Keijser Th. H.,Mittemeijer E. J.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.44.13519/fulltext

Reference37 articles.

1. Free energy spectra for inelastic deformation of five metallic glass alloys

2. Ideal elastic, anelastic and viscoelastic deformation of a metallic glass

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