Direct measurement of field effects on surface diffusion
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.58.R13423/fulltext
Reference15 articles.
1. Field ion microscope studies of single-atom surface diffusion and cluster nucleation on metal surfaces
2. Electromigration on semiconductor surfaces
3. The effective charge in surface electromigration
4. ‘‘Tracking’’ tunneling microscopy
5. Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
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