‘‘Tracking’’ tunneling microscopy-Reference-Cited by-同舟云学术

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‘‘Tracking’’ tunneling microscopy

Published:1988-06 Issue:6 Volume:59 Page:840-842
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Pohl D. W.,Möller R.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1139790

Reference13 articles.

1. Atomic and electronic contributions to Si(111)-(7×7) scanning-tunneling-microscopy images

2. Atom-selective imaging of the GaAs(110) surface

3. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy

4. Near‐field optical‐scanning microscopy

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3. Analysis of Al adatoms random hopping on Si(100)-c(4 × 2) surface observed by STM at low temperature: Determination of the hopping barriers;Surface Science;2022-06

4. Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy;Japanese Journal of Applied Physics;2020-05-29

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