Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.76.459/fulltext
Reference16 articles.
1. Atomic processes in crystal growth
2. Monte Carlo simulation of thin film growth on Si surfaces
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4. Field ion microscope studies of single-atom surface diffusion and cluster nucleation on metal surfaces
5. Energetics and Dynamics of Si Ad-Dimers on Si(001)
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