Cross-sectional lateral-force microscopy of semiconductor heterostructures and multiple quantum wells
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.52.R8625/fulltext
Reference8 articles.
1. Nanosize stress concentrators at facets in Zn1-xCdxSe/ZnSe multiple quantum well laser structures
2. Lateral forces during atomic force microscopy of graphite in air
3. Atomic-scale contrast mechanism in atomic force microscopy
4. Cross-sectional transmission electron microscopy parallel to the active stripe of degraded buried heterostructure distributed feedback laser devices
5. Exciton spectroscopy inZn1−xCdxSe/ZnSe quantum wells
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