Cross-sectional transmission electron microscopy parallel to the active stripe of degraded buried heterostructure distributed feedback laser devices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.108588
Reference9 articles.
1. III-V Device Technologies for Lightwave Applications
2. Defect mechanisms in degradation of 1.3-μm wavelength channeled-substrate buried heterostructure lasers
3. 1/2 〈100〉 {100} dislocation loops in a zinc blende structure
4. TEM Cross Section Sample Preparation Technique for III–V Compound Semiconductor Device Materials by Chemical Thinning
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Grating overgrowth and defect structures in distributed-feedback-buried heterostructure laser diodes;IEEE Journal of Selected Topics in Quantum Electronics;1997-06
2. A Defect Map for Degradation of Ingaasp/Inp Long Wavelength Laser Diodes;MRS Proceedings;1996
3. Cross-sectional lateral-force microscopy of semiconductor heterostructures and multiple quantum wells;Physical Review B;1995-09-15
4. Long Wavelength Laser Diode Reliability and Lattice Imperfections;MRS Bulletin;1993-12
5. Semiconductor laser damage due to human-body-model electrostatic discharge;Journal of Applied Physics;1993-08
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