Abstract
AbstractWe summarize the characteristic defect structures associated with gradual-degradation, rapiddegradation, catastrophic (mirror-facet) optical damage (COD), electric static discharge (ESD) and electric overstress (EOS) damages to provide a defect-map for device failure mode analysis. The generation mechanisms of these lattice defects are discussed which pinpoint the weak links in the device structures.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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1. Optical Properties;Materials Science in Microelectronics II;2006