High-resolution energy analysis of field-assisted photoemission: A spectroscopic image of hot-electron transport in semiconductors
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.47.3603/fulltext
Reference35 articles.
1. Hot-Electron Emission From Shallowp−nJunctions is Silicon
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