Simplified bond-hyperpolarizability model of second harmonic generation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.65.205320/fulltext
Reference30 articles.
1. Optical characterisation of semiconductor surfaces and interfaces
2. Characterization of semiconductor interfaces by second-harmonic generation
3. Identification of strained silicon layers at Si-SiO2interfaces and clean Si surfaces by nonlinear optical spectroscopy
4. Second‐harmonic generation in Si–SiO2 heterostructures formed by chemical, thermal, and plasma‐assisted oxidation and deposition processes
5. Influence of surface roughness on the electrical properties of Si–SiO2 interfaces and on second-harmonic generation at these interfaces
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