Capillary-force measurement on SiC surfaces
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevE.93.062803/fulltext
Reference40 articles.
1. Force measurements with the atomic force microscope: Technique, interpretation and applications
2. Critical Review: Adhesion in surface micromechanical structures
3. Nanoelectromechanical systems
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