Argon-hydrogen plasma jet investigated by active and passive spectroscopic means
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevE.49.4397/fulltext
Reference15 articles.
1. Amorphous hydrogenated silicon films produced by an expanding argon-silane plasma investigated with spectroscopic IR ellipsometry
2. FAST PLASMA DEPOSITION OF CARBON AND SILICON LAYERS
3. A combined Thomson–Rayleigh scattering diagnostic using an intensified photodiode array
4. Fabry–Pérot line shape analysis on an expanding cascaded arc plasma in argon
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