Interpretation of Potential-Probe Measurements in Two-Carrier Structures
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRev.137.A295/fulltext
Reference10 articles.
1. Accurate solution of an idealized one-carrier metal-semiconductor junction problem
2. Static Space Charge and Capacitance for a Single Blocking Electrode
3. Static Space Charge and Capacitance for Two‐Blocking Electrodes
4. Microprobing of functioning semiconductor devices for internal voltage and current distributions
5. Probing the Space-Charge Layer in ap−nJunction
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