Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices-Reference-Cited by-同舟云学术

Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices

Published:2005-04 Issue:2 Volume:30 Page:71-124
ISSN:1040-8436
Container-title:Critical Reviews in Solid State and Materials Sciences
language:en
Short-container-title:Critical Reviews in Solid State and Materials Sciences

Author:

Kuntze S. B.,Ban D.,Sargent E. H.,Dixon-Warren St. J.,White J. K.,Hinzer K.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,General Chemical Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/10408430590952523

Reference128 articles.

1. Atomic Force Microscope

2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

3. Two-dimensional profiling in silicon using conventional and electrochemical selective etching

4. Tip for scanning tunneling microscopy made of monocrystalline, semiconducting, chemical vapor deposited diamond

5. Electronic properties of CVD and synthetic diamond

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