Scanning Gate Microscopic Investigation of Graphene Nanoribbon Underneath Dielectric Layer
Author:
Affiliation:
1. Department of Physics, Chungnam National University, Daejeon 34134, Republic of Korea
Funder
Chungnam National University
Publisher
The Korean Vacuum Society
Link
https://pdf.medrang.co.kr/ASCT/2024/033/ASCT033-02-50.pdf
Reference26 articles.
1. Direct Observation of Graphene Growth and Associated Copper Substrate Dynamics by in Situ Scanning Electron Microscopy
2. Recent developments and new strategies in scanning electron microscopy*
3. Sparsity-Based Super Resolution for SEM Images
4. Orientational Ordering of Graphene Oxide Membranes by a Spin Probe Technique and SEM Image Analysis
5. The scanning electron microscope in microbiology and diagnosis of infectious disease
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