Void-mediated coherency-strain relaxation and impediment of cubic-to-hexagonal transformation in epitaxial metastable metal/semiconductor TiN/Al0.72Sc0.28N multilayers-Reference-Cited by-同舟云学术

Void-mediated coherency-strain relaxation and impediment of cubic-to-hexagonal transformation in epitaxial metastable metal/semiconductor TiN/Al0.72Sc0.28N multilayers

Published:2017-08-17 Issue:3 Volume:1 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Garbrecht Magnus,Hultman Lars,Fawey Mohammed H.,Sands Timothy D.,Saha Bivas

Funder

Knut och Alice Wallenbergs Stiftelse

Vetenskapsrådet

National Science Foundation

U.S. Department of Energy

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.1.033402/fulltext

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