Electron emission induced by fast heavy ions in a thin silicon crystal-Reference-Cited by-同舟云学术

Electron emission induced by fast heavy ions in a thin silicon crystal

Published:2004-09-09 Issue:3 Volume:70 Page:
ISSN:1050-2947
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Barrué F.,Chevallier M.,Dauvergne D.,Kirsch R.,Poizat J.-C.,Ray C.,Adoui L.,Cassimi A.,Rothard H.,Toulemonde M.,Cohen C.,L’Hoir A.,Vernhet D.,Demonchy C.,Giot L.,Mittig W.,Pita S.,Roussel-Chomaz P.,Billebaud A.

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.70.032902/fulltext

Reference15 articles.

1. Review on kinetic ion-electron emission from solid metallic targets

2. Correlation between energy loss and ion-induced electron emission of 1 MeV protons channeled along the 〈100〉 axis of a thin silicon crystal

3. Energy spectra of secondary electrons induced by fast ions under channeling conditions

4. Secondary electrons induced by fast ions under channeling conditions. I. Production and emission of secondary electrons

5. Secondary electrons induced by fast ions under channeling conditions. II. Screening of fast heavy ions in solids

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4. Study of ion emission from a germanium crystal surface under impact of fast Pb ions in channeling conditions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-03

5. Using channeling properties for studying the impact-parameter dependence of electron capture by 20-MeV/u uranium ions in a silicon crystal;Physical Review A;2007-12-18