Author:
Kudo Hiroshi,Shima Kunihiro,Masuda Kohzoh,Seki Seiji
Publisher
American Physical Society (APS)
Cited by
19 articles.
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1. Resonant coherent excitation of C5+ in Si observed with backward electron spectroscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-03
2. Electron emission induced by fast heavy ions in a thin silicon crystal;Physical Review A;2004-09-09
3. Electron loss from fast partially stripped C and O ions incident on crystal targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-07
4. Ion-induced electron measurements using crystal targets overlaid with noncrystalline layers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-04
5. Feasibility of a cylindrical mirror electron analyzer for structural analysis of crystalline materials using weak ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-07