Author:
L’Hoir A.,Koumeir C.,Della Negra S.,Boduch P.,Roussel-Chomaz P.,Cassimi A.,Chevallier M.,Cohen C.,Dauvergne D.,Fallavier M.,Jacquet D.,Manil B.,Poizat J.-C.,Ray C.,Rothard H.,Schmaus D.,Toulemonde M.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. Mass spectrometric investigation of material sputtered under swift heavy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-11
2. Secondary ion formation during electronic and nuclear sputtering of germanium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-06
3. Secondary ion formation on indium under nuclear and electronic sputtering conditions;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05
4. Electronic sputtering of thin lithium fluoride films induced by swift heavy ions;Materials Research Express;2015-07-21
5. Crystal assisted experiments for multi-disciplinary physics with heavy ion beams at GANIL;Journal of Physics: Conference Series;2015-07-13