Mass spectrometric investigation of material sputtered under swift heavy ion bombardment

Author:

Breuer L.,Ernst P.,Herder M.,Meinerzhagen F.,Bender M.,Severin D.,Wucher A.

Funder

BMBF

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference56 articles.

1. Sputtering by Particle Bombardment, Vol. I – IV, in: R. Behrisch et al. (eds.), Topics in Applied Physics Vol. 42, 52, 64 and 110, Springer.

2. Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects and Trends;Benninghoven,1987

3. Special issue on fundamental processes in sputtering of atoms and molecules (SPUT92), in: P. Sigmund (ed.), [Mat. Fys. Medd. 43 (1993)].

4. Ion beam science: solved and unsolved problems, in: Det Kongelige Danske Videnskabernes Selskab, P. Sigmund (ed.), 2006.

5. Electronic sputtering with swift heavy ions;Assmann,2007

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