Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV-Reference-Cited by-同舟云学术

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Published:2016-08-09 Issue:7 Volume:117 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Linck Martin,Hartel Peter,Uhlemann Stephan,Kahl Frank,Müller Heiko,Zach Joachim,Haider Max.,Niestadt Marcel,Bischoff Maarten,Biskupek Johannes,Lee Zhongbo,Lehnert Tibor,Börrnert Felix,Rose Harald,Kaiser Ute

Funder

Deutsche Forschungsgemeinschaft

Ministerium für Wissenschaft, Forschung und Kunst Baden-Württemberg

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.117.076101/fulltext

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4. Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy

5. Irradiation effects in carbon nanostructures

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