Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
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1. Progress in atomic-resolution aberration corrected conventional transmission electron microscopy (CTEM);Progress in Materials Science;2023-03
2. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV;Physical Review Letters;2016-08-09
3. Nearly-free electronlike surface resonance of aβ−Si3N4(0001)/Si(111)−8×8interface;Physical Review B;2015-02-09
4. Zernike phase contrast cryo-electron microscopy reveals 100 kDa component in a protein complex;Journal of Physics D: Applied Physics;2013-11-22
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