Local Atomic Environment of Si Suboxides at theSiO2/Si(111)Interface Determined by Angle-Scanned Photoelectron Diffraction
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.86.4068/fulltext
Reference13 articles.
1. Chemical Structures of the SiO2Si Interface
2. Ordering atSi(111)a−Siand Si(111)/SiO2Interfaces
3. Microscopic structure of theSiO2/Si interface
4. Dynamic observations of interface propagation during silicon oxidation
5. Photoemission Extended Fine Structure Study of the SiO2/Si(111) Interface
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