Author:
Pereira J. A. M.,da Silveira E. F.
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. MeV Cluster Ion Beam–Material Interaction;Quantum Beam Science;2022-01-24
2. Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power;Journal of the American Society for Mass Spectrometry;2020-05-26
3. Mass spectrometric investigation of material sputtered under swift heavy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-11
4. Secondary ion formation during electronic and nuclear sputtering of germanium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-06
5. Secondary ion formation on indium under nuclear and electronic sputtering conditions;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05